Advanced Characterization Techniques for Thin Film Solar Cells

الموضوع في 'قسم الفيزياء' بواسطة Elmajbery, بتاريخ ‏يناير 4, 2017.

  1. Elmajbery

    Elmajbery Well-Known Member

    إنضم إلينا في:
    ‏يوليو 21, 2008
    المشاركات:
    899
    الإعجابات المتلقاة:
    840
    نقاط الجوائز:
    108
    الوظيفة:
    أستاذ جامعى - دكتوراه


    [​IMG]

    Advanced Characterization Techniques for Thin Film Solar Cells
    Daniel Abou-Ras and Thomas Kirchartz
    English | Oct. 10 2016 | ISBN-10: 3527339922 | 760 pages | PDF | 23,4 mb


    The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D.
    Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.
    هذا المحتوى يظهر للاعضاء المسجلين فقط:
    هذا المحتوى يظهر للاعضاء المسجلين فقط:
     
    sumerland137 و mann1 معجبون بهذا.

مشاركة هذه الصفحة