X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
Publisher: Springer | English | PDF | 2004 | 211 pages | ISBN: 3540201793 | 5.3 MB
This monograph represents a critical survey about the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic materials systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers and is of particular relevance at semiconductor layer systems where e.g. interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesocopic structures is given followed by a valuable description of various experimental techniques.
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