Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems)
Springer | 2010-09-01 | ISBN: 1441966056 | 256 pages | PDF | 4 MB
This book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations, and provides solutions recently proposed in the Electronic Design Automation (EDA) community. The material serves as a comprehensive reference for researchers and practitioners interested in the problem of estimating extreme statistics for memories.