alkasser75
New Member
Please email me the following articles
1-Barr L. W. The Origin of Quantitative Diffusion Measurements in Solids: A Centenary View Defect and Diff. Forum 143-147, 3 (1997)
2. Tuijn C. On the History of Models for Solid-State Diffusion Defect and Diff. Forum 143-147, 11 (1997)
3. Fahey P. M., Griffin P. B., Plummer J. D. Point Defects and Dopant Diffusion in Silicon Rev. Mod. Phys. 61, 289 (1989)
4. Paul D. J. Silicon-Germanium Strained Layer Materials in Microelectronics Advanced Materials 11 (3), 191 (1999)