عشرة كتب عن
X-Ray Spectrometry
الكتاب الأول
X-Ray Spectrometry: Recent Technological Advances
By
Kouichi Tsuji, Jasna Injuk , René Van Grieken
Publisher: Wiley
Number Of Pages: 616
Publication Date: 2004-04-30
Sales Rank: 1824488
ISBN / ASIN: 047148640X
EAN: 9780471486404
Binding: Hardcover
Number Of Pages: 616
Publication Date: 2004-04-30
Sales Rank: 1824488
ISBN / ASIN: 047148640X
EAN: 9780471486404
Binding: Hardcover
Book Description
X-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry.
Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays
Introduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trends
Written by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields
Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Special Configurations, New Computerization Methods, New Applications
This valuable book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.
Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays
Introduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trends
Written by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields
Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Special Configurations, New Computerization Methods, New Applications
This valuable book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.
Link
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الكتاب الثاني
Two-dimensional X-ray Diffraction
By: Bob Baoping He
Publisher: Wiley
Number Of Pages: 434
Publication Date: 2009-08-10
ISBN-10 / ASIN: 0470227222
ISBN-13 / EAN: 9780470227220
By: Bob Baoping He
Publisher: Wiley
Number Of Pages: 434
Publication Date: 2009-08-10
ISBN-10 / ASIN: 0470227222
ISBN-13 / EAN: 9780470227220
Product Description
Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to researchers in materials science, chemistry, physics, and pharmaceuticals, as well as graduate-level students in these areas.
Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to researchers in materials science, chemistry, physics, and pharmaceuticals, as well as graduate-level students in these areas.
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الكتاب الثالث
X-Ray Diffraction: In Crystals, Imperfect Crystals, and Amorphous Bodie
By
A. Guinier
Publisher: Dover Publications
Number Of Pages: 378
Publication Date: 1994-06-07
ISBN-10 / ASIN: 0486680118
ISBN-13 / EAN: 9780486680118
A. Guinier
Publisher: Dover Publications
Number Of Pages: 378
Publication Date: 1994-06-07
ISBN-10 / ASIN: 0486680118
ISBN-13 / EAN: 9780486680118
Book Description
Superb study begins with fundamentals of x-ray diffraction theory using Fourier transforms, then applies general results to various atomic structures, amorphous bodies, crystals and imperfect crystals. Elementary laws of x-ray diffraction on crystals follow as special case. Highly useful for solid-state physicists, metallographers, chemists, and biologists. 154 illustrations. 1963 edition.
Superb study begins with fundamentals of x-ray diffraction theory using Fourier transforms, then applies general results to various atomic structures, amorphous bodies, crystals and imperfect crystals. Elementary laws of x-ray diffraction on crystals follow as special case. Highly useful for solid-state physicists, metallographers, chemists, and biologists. 154 illustrations. 1963 edition.
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الكتاب الرابع
Introduction to X-Ray Powder Diffractometry
By
Ron Jenkins, Robert Snyder
Publisher/ Wiley-Interscience
Number Of Pages: 432
Publication Date: 1996-06-28
ISBN-10 / ASIN: 0471513393
ISBN-13 / EAN: 9780471513391
Binding: Hardcover
Table of Contents
Preface Cumulative Listing of Volumes in Series Ch. 1 Characteristics of X-Radiation 1 Ch. 2 The Crystalline State 23 Ch. 3 Diffraction Theory 47 Ch. 4 Sources for the Generation of X-Radiation 97 Ch. 5 Detectors and Detection Electronics 121 Ch. 6 Production of Monochromatic Radiation 151 Ch. 7 Instruments for the Measurement of Powder Patterns 173 Ch. 8 Alignment and Maintenance of Powder Diffractometers 205 Ch. 9 Specimen Preparation 231 Ch. 10 Acquisition of Diffraction Data 261 Ch. 11 Reduction of Data from Automated Powder Diffractometers 287 Ch. 12 Qualitative Analysis 319 Ch. 13 Quantitative Analysis 355 Appendix A: Common X-Ray Wavelengths 389 Appendix B: Mass Attenuation Coefficients 390 Appendix C: Atomic Weights and Densities 391 Appendix D: Crystallographic Classification of the 230 Space Groups 392 Index 397
LinK
[hide]http://lib.freescienceengineering.org/view.php?id=553732[/hide].........................................................................................
الكتاب الخامس
X-Ray Diffraction by Macromolecules
(Springer Series in Chemical Physics)
By/ N. Kasai, M. Kakudo
Publisher: Springer
Number Of Pages: 504
Publication Date: 2005-08-22
ISBN-10 / ASIN: 3540253173
ISBN-13 / EAN: 9783540253174
Binding: Hardcover
Number Of Pages: 504
Publication Date: 2005-08-22
ISBN-10 / ASIN: 3540253173
ISBN-13 / EAN: 9783540253174
Binding: Hardcover
Product Description
The audience for this thorough overview includes advanced undergraduates and postgraduate researchers in macromolecular sciences who can benefit from more familiarity with the use of X-ray diffraction for obtaining structural information on biological substances, natural and synthetic high polymeric materials. X-Ray Diffraction by Macromolecules comprises three parts: fundamental, experimental and analytical, and the volume as a whole may serve as an intermediate textbook to bridge the treatments found in primers and specialist works. It presents a thorough treatment of principles and applications, and gives full, practical details on experimental methods and the treatment of results, along with many examples of actual analysis
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الكتاب السادس
X-Ray Diffraction by Polycrystalline Materials
By
Rene Guinebretiere
Publisher/ ISTE Publishing Company
Number Of Pages: 288
Publication Date: 2008-02-04
ISBN-10 / ASIN: 1905209215
ISBN-13 / EAN: 9781905209217
Binding: Hardcover
By
Rene Guinebretiere
Publisher/ ISTE Publishing Company
Number Of Pages: 288
Publication Date: 2008-02-04
ISBN-10 / ASIN: 1905209215
ISBN-13 / EAN: 9781905209217
Binding: Hardcover
Book Description
This book presents a physical approach to the diffraction phenomenon and its applications in materials science.
An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction.
Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
This book presents a physical approach to the diffraction phenomenon and its applications in materials science.
An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction.
Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
Link
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...........................................................................الكتاب السابع
X-ray Characterization of Materials
By/ Eric Lifshin
Publisher: Wiley-VCH
Number Of Pages: 278
Publication Date: 1999-07-28
ISBN-10 / ASIN: 3527296573
ISBN-13 / EAN: 9783527296576
Product Description
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials.
The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
By/ Eric Lifshin
Publisher: Wiley-VCH
Number Of Pages: 278
Publication Date: 1999-07-28
ISBN-10 / ASIN: 3527296573
ISBN-13 / EAN: 9783527296576
Product Description
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials.
The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
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الكتاب الثامن
Crystal Structure Analysis for Chemists and Biologists
(Methods in Stereochemical Analysis)
By
Jenny P. Glusker, Mitchell Lewis, Miriam Rossi
Publisher: Wiley-VCH
Number Of Pages: 872
Publication Date: 1994-08
ISBN-10 / ASIN: 0471185434
ISBN-13 / EAN: 9780471185437
Binding: Hardcover
Product Description
The fields of structural chemistry and biochemistry have blossomed in the last seventy years since X-ray diffraction was discovered in 1912. Dorothy Hodgkin, who obtained a Nobel Prize in 1965 for her X-ray diffraction work wrote 'a great advantage of X-ray analysis as a method of chemical structure analysis is its power to show some totally unexpected and surprising structure with, at the same time, complete certainty.' The results of all X-ray diffraction studies are used by chemists and buiochemists but these scientists need to be able to appreciate the significance and extent to which these results may be used.
A number of books written for practicing crystallographers cover the theory and applications of X-ray diffraction, but few are of real practical use to non-specialists. In 'Crystal Structure Analysis for Biologists and Chemists', the general principles of crystal structure are presented in a highly readable way. The book of Glusker, who is internationally renowned, provides good coverage of theory, including data and understanding their significance.
The fields of structural chemistry and biochemistry have blossomed in the last seventy years since X-ray diffraction was discovered in 1912. Dorothy Hodgkin, who obtained a Nobel Prize in 1965 for her X-ray diffraction work wrote 'a great advantage of X-ray analysis as a method of chemical structure analysis is its power to show some totally unexpected and surprising structure with, at the same time, complete certainty.' The results of all X-ray diffraction studies are used by chemists and buiochemists but these scientists need to be able to appreciate the significance and extent to which these results may be used.
A number of books written for practicing crystallographers cover the theory and applications of X-ray diffraction, but few are of real practical use to non-specialists. In 'Crystal Structure Analysis for Biologists and Chemists', the general principles of crystal structure are presented in a highly readable way. The book of Glusker, who is internationally renowned, provides good coverage of theory, including data and understanding their significance.
LinK
[hide]http://lib.freescienceengineering.org/view.php?id=923391[/hide]
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الكتاب التاسع
Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
BY// Georg Will
Publisher: Springer
Number Of Pages: 224
Publication Date: 2005-12-07
ISBN-10 / ASIN: 3540279857
ISBN-13 / EAN: 9783540279853
BY// Georg Will
Publisher: Springer
Number Of Pages: 224
Publication Date: 2005-12-07
ISBN-10 / ASIN: 3540279857
ISBN-13 / EAN: 9783540279853
Product Description
Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination.
Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination.
Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
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الكتاب العاشر
Parametric X-Ray Radiation in Crystals: Theory, Experiment and Applications
(Springer Tracts in Modern Physics)
By
Vladimir G. Baryshevsky, Ilya D. Feranchuk, Alexander P. Ulyanenkov
Vladimir G. Baryshevsky, Ilya D. Feranchuk, Alexander P. Ulyanenkov
Publisher: Springer
Number Of Pages: 171
Publication Date: 2006-02-10
ISBN-10 / ASIN: 3540269053
ISBN-13 / EAN: 9783540269052
Binding: Hardcover
Number Of Pages: 171
Publication Date: 2006-02-10
ISBN-10 / ASIN: 3540269053
ISBN-13 / EAN: 9783540269052
Binding: Hardcover
Book Description
This systematic and comprehensive monograph is devoted to parametric X-ray radiation (PXR). This radiation is generated by the motion of electrons inside a crystal, whereby the emitted photons are diffracted by the crystal and the radiation intensity critically depends on the parameters of the crystal structure. Nowadays PXR is the subject of numerous theoretical and experimental studies throughout the world. The first part of the book is a theoretical treatment of PXR, which includes a new approach to describe the radiation process in crystals. The second part is a survey of PXR experimental results and the possible applications of PXR as a tool for crystal structure analysis and a source of tunable X-ray radiation.
This systematic and comprehensive monograph is devoted to parametric X-ray radiation (PXR). This radiation is generated by the motion of electrons inside a crystal, whereby the emitted photons are diffracted by the crystal and the radiation intensity critically depends on the parameters of the crystal structure. Nowadays PXR is the subject of numerous theoretical and experimental studies throughout the world. The first part of the book is a theoretical treatment of PXR, which includes a new approach to describe the radiation process in crystals. The second part is a survey of PXR experimental results and the possible applications of PXR as a tool for crystal structure analysis and a source of tunable X-ray radiation.
LinK
[hide]http://lib.freescienceengineering.org/view.php?id=507817[/hide]..............................................................
الكتاب الحادي عشر
Crystal Structure Analysis: Principles and Practice
(International Union of Crystallography)
By
Alexander J Blake, Jacqueline M Cole, John S O Evans, Peter Main, Simon Parsons, David J Watkin
(International Union of Crystallography)
By
Alexander J Blake, Jacqueline M Cole, John S O Evans, Peter Main, Simon Parsons, David J Watkin
Publisher
Oxford University Press, USA
Number Of Pages: 352
Publication Date: 2009-08-16
ISBN-10 / ASIN: 019921946X
ISBN-13 / EAN: 9780199219469
Oxford University Press, USA
Number Of Pages: 352
Publication Date: 2009-08-16
ISBN-10 / ASIN: 019921946X
ISBN-13 / EAN: 9780199219469
Product Description
This text focuses on the practical aspects of crystal structure analysis, and provides the necessary conceptual framework for understanding and applying the technique. By choosing an approach that does not put too much emphasis on the mathematics involved, the book gives practical advice on topics such as growing crystals, solving and refining structures, and understanding and using the results. The technique described is a core experimental method in modern structural chemistry, and plays an ever more important role in the careers of graduate students, postdoctoral and academic staff in chemistry, and final-year undergraduates.
Much of the material of the first edition has been significantly updated and expanded, and some new topics have been added. The approach to several of the topics has changed, reflecting the book's new authorship, and recent developments in the subject.
Much of the material of the first edition has been significantly updated and expanded, and some new topics have been added. The approach to several of the topics has changed, reflecting the book's new authorship, and recent developments in the subject.
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الكتاب الثاني عشر
Thin Film Analysis by X-Ray Scattering
By/ Mario Birkholz
Publisher: Wiley-VCH
Number Of Pages: 378
Publication Date: 2006-02-06
Sales Rank: 919405
ISBN / ASIN: 3527310525
EAN: 9783527310524
By/ Mario Birkholz
Publisher: Wiley-VCH
Number Of Pages: 378
Publication Date: 2006-02-06
Sales Rank: 919405
ISBN / ASIN: 3527310525
EAN: 9783527310524
Book Description
With contributions by Paul F. Fewster and Christoph Genzel
While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications.
Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
With contributions by Paul F. Fewster and Christoph Genzel
While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications.
Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
والسلام عليكم ورحمة الله وبركاته
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