deepa08
Well-Known Member
VLSI Test Principles and Architectures By Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Morgan Kaufmann | 2006-07-07 | ISBN: 0123705975 | 808 pages | PDF | 4,9 MB
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
Download:
http://depositfiles.com/files/kt7mp5of3
http://www.uploading.com/files/ZD6CX8A7/VLSITePrin.zip.html
Morgan Kaufmann | 2006-07-07 | ISBN: 0123705975 | 808 pages | PDF | 4,9 MB
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
Download:
http://depositfiles.com/files/kt7mp5of3
http://www.uploading.com/files/ZD6CX8A7/VLSITePrin.zip.html