كيمياء فيزيائية مجموعة كتب حول X-Ray من الناحية الكيميائية

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Methods of X-ray and Neutron Scattering in Polymer Science ​

(Topics in Polymer Science)

Oxford University Press, USA



by Ryong-Joon Roe




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  • Publisher: Oxford University Press, USA ​
  • Number Of Pages: 352 ​
  • Publication Date: 2000-01-06 ​
  • Binding: Hardcover ​

Product Description



Methods of X-ray and Neutron Scattering in Polymer Science presents the basic theories underlying x-ray and neutron scattering--two of the most powerful tools for characterizing materials--and also covers the various techniques that have been developed for their application to the study of polymers. While there is a great deal of similarity between the x-ray and neutron scattering methods, the two were developed in different time periods by different groups of scientists, and as a result very distinct terminologies evolved to explain the same phenomena. In this unique text the two are presented together from the very beginning, with a consistent set of symbols and terminologies, so that students can become equally familiar with both from the outset. Also, to help students gain a unified view of diffraction, the distinction between wide-angle diffraction and small-angle scattering is postponed until late in the text.
Methods of X-ray and Neutron Scattering in Polymer Science emphasizes basic concepts rather than details of specific techniques and derives relationships from first premises wherever possible. Beginning with coverage of the basic properties of x-rays and neutrons and their scattering from matter, it goes on to discuss methods of studying specific types of samples or properties. Topics covered include single-component crystalline and amorphous polymers; the small-angle scattering technique; binary, single-phase systems such as polymer blend and polymer solution; the technique of reflectivity measurement; and polymer dynamics by means of inelastic neutron scattering.
A perfect introductory textbook for graduate and advanced undergraduate students in polymer science,Methods of X-ray and Neutron Scattering in Polymer Science also serves as a helpful self-study tool for polymer scientists seeking an introduction to scattering techniques. Further reading lists at the end of each chapter encourage readers to explore more advanced topics on their own.


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High Resolution X-Ray Diffractometry And Topography

High Resolution X-Ray Diffractometry And Topography​

By D.K. Bowen, Brian K. Tanner​



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  • Publisher: CRC ​
  • Number Of Pages: 252 ​
  • Publication Date: 1998-02-05 ​
  • Binding: Hardcover ​
Product Description​



The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.​

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Chemical Crystallography - An Introduction To Optical And X Ray Methods.

Chemical Crystallography ​

An Introduction To Optical And X Ray Methods​

by C.W. Bunn ​


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Product Details
Paperback: 468 pages ​
  • Publisher: Bunn Press ​
  • (March 15, 2007) ​
  • Language: English ​
Product Description​


Text extracted from opening pages of book: CHEMICAL CBYSTALLOGRAPHY AN. INTRODUCTION TO OPTICAL AND X-RAY METHODS BY C. W. BUNN OXFORD AT THE CLARENDON PRESS Oxford University Press, Amen House, London E. G. 4 GLASGOW NEW YORK TORONTO MELBOURNE WELLINGTON BOMBAY CALCUTTA MADRAS CAPETOWN Geoffrey Cumberlege, Publisher to the University FIRST PUBLISHED 1045 REPRINTED WITH CORRECTIONS 1946 Reprinted lithographically in Great Britain at the UNIVERSITY PRESS, OXFORD, 1948, 1949, 1952, from corrected sheets of the second impression PREFACE CEYSTALLOGRAPHIC methods are used in chemistry for two main pur poses the identification of solid substances, and the determination of atomic configurations ; there are also other applications, most of which, as far as technique is concerned, may* be said to lie between the two main subjects. This baok is intended to be a guide to these methods. I have tried to explain the elementary principles involved, and to give as much practical information as will enable the reader to start using the methods described. I have not attempted to give a rigorous treat ment of the physical principles: the f approach is consistently from the chemist's point of view, and physical theory is included only in so far as it is necessary for the general comprehension of the principles and methods described. Nor have I attempted to give an exhaustive account of any subject ; the aim throughout has been to lay the founda tions, and to give sufficient references ( either to larger works or to original papers) to enable the reader to follow up any subject in greater detail if he so desires. The treatment of certain subjects is perhaps somewhat unorthodox. Crystal morphology, for instance, is described in terms of the concept of the unit cell ( rather than in terms of the axial ratios of the earlier morphologists), and is approached by way of the phenomena of crystal growth. The optical properties of crystals are described solely in terms of the phenomena observed in the polarizing microscope. X-ray diffrac tion is considered first in connexion with powder photographs; it is moj* e usual to start with the interpretation of the diffraction effects of single crystals. These methods of treatment are dictated by the form and scope of the book ; they also reflect the course of the writer's own experience in applying crystallographic methods to chemical problems. It is therefore hoped that they may at any rate seem natural to those to whom the book is addressed - students of chemistry who wish to acquire some knowledge of crystallographic methods, and research workers who wish to make practical use of such methods. If the book should come to the notice of a more philosophical reader, I can only hope that any qualms such a reader may feel about its avoidance of formal physical or mathematical treatment may be somewhat offset by the interest of a novel, if rather severely practical, viewpoint. The difficulties of three-dimensional thinking have, I hope, been lightened as much as possible by the provision of a large number of vi PREFACE diagrams ; but crystallography is emphatically not a subject which can be learnt solely from books: solid models should be used freely models of crystal shapes, of atomic . nd molecular configurations, of reciprocal lattices and of vectorial representations of optical and other physical properties. Most of the diagrams are original, but a few have been reproduced, by permission, from published books and journals: Figs. 197, 207-9, 215, and 222 from the Journal of the Chemical Society ; Figs. 199, 203, and 217 from the Proceedings of the Royal Society, Figs. 102-4 from the Journal of Scientific Instruments ; Fig. 229 from the Journal of the American Chemical Society, Fig. 161 from Inter nationale Tabetten ftir Bestimmung von Kristallstrukturen ( Berlin: Born traeger); Fig. 192 from the * Strnkturbericht ' of the Zeitschrift fttr Kristallographie\ and Figs. 212 and 216 from Bragg's The Crystalline State ​


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X-Ray Charge Densities and Chemical Bonding

X-Ray Charge Densities and Chemical Bonding ​

International Union of Crystallography Texts on Crystallography , No 4​


By Philip Coppens​


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  • Publisher: Oxford University Press, USA ​
  • Number Of Pages: 384 ​
  • Publication Date: 1997-05-08 ​
  • Binding: Hardcover ​
Product Description


This book deals with the electron density distribution in molecules and solids as obtained experimentally by X-ray diffraction. It is a comprehensive treatment of the methods involved, and the interpretation of the experimental results in terms of chemical bonding and intermolecular interactions. Inorganic and organic solids, as well as metals, are covered in the chapters dealing with specific systems. As a whole, this monograph is especially appealing because of its broad interface with numerous disciplines. Accurate X-ray diffraction intensities contain fundamental information on the charge distribution in crystals, which can be compared directly with theoretical results, and used to derive other physical properties, such as electrostatic moments, the electrostatic potential and lattice energies, which are accessible by spectroscopic and thermodynamic measurements. Consequently, the work will be of great interest to a broad range of crystallographers and physical scientists.​




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X-Ray Absorption and Emission in Analytical Chemistry​


By H.A., H.G. Pfeiffer, E.H. Winslow, and P.D. Zemany *SIGNED by author* Liebhafsky​



  • Publisher: John Wiley & Sons, Inc. ​
  • Number Of Pages: 357 ​
  • Publication Date: 1960 ​
  • ISBN-10 / ASIN: 0471534277 ​
  • ISBN-13 / EAN: 9780471534273 ​
  • Binding: Hardcover ​
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