مجموعة كتب حول X - Ray من الناحيه الفيزيائيه

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X-Ray Lasers 2006


Proceedings of the 10th International Conference

August 20-25, Berlin, Germany


(Springer Proceedings in Physics)

by P.V. Nickles


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Product Details


  • Hardcover: 600 pages
  • Publisher: Springer; 1 edition
  • (May 18, 2007)
  • Language: English
Product Description



The search for table-top and repetitive pump schemes during the last decade has been the driving force behind the spectacular advances demonstrated during the 10th International Conference on X-Ray Lasers, organized in 2006 in Berlin. Since 1986, international experts have gathered every two years at this established conference to discuss the progress in theory, experiment and application of plasma-based soft X-ray lasers. Traditionally, the conference sessions devoted to complementary and alternative sources of short wavelength radiation, such as high harmonics, XFEL or incoherent X-rays are organized so as to emphasize the role of X-ray laser research in relation to the other short wavelength sources. Grazing incidence pumping (GRIP) and seeding with high harmonics were the dominant topics of the conference. High repetition rate and portable X-ray lasers were reported to have been applied in metrology and photochemistry for the first time.
The proceedings of this series of conferences constitute a comprehensive source of reference of the acknowledged state-of the-art in this specific area of laser and plasma physics.


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X-Ray Spectrometry

Recent Technological Advances


By Kouichi Tsuji, Jasna Injuk, René Van Grieken




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  • Publisher: Wiley
  • Number Of Pages: 616
  • Publication Date: 2004-04-30
  • Binding: Hardcover
Product Description




X-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry.
  • Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays
  • Introduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trends
  • Written by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields
  • Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Special Configurations, New Computerization Methods, New Applications
This valuable book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.



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Introduction to X-Ray Powder Diffractometry


by Ron Jenkins Robert L. Snyder




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  • Publisher: Wiley-Interscience

    Number Of Pages: 432

    Publication Date: 1996-06-28
  • Binding: Hardcover
Product Description

When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity.

Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation.

The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis.

While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material.

Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry.

X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years.

This timely, authoritative volume features:
* Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer
* A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques
* Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis
* An accessible presentation appropriate for both students and professionals
* More than 230 tables and illustrations

Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.

From the Publisher
Illustrated with a significant amount of useful figures and diagrams this volume contains all of the fundamentals required to understand the theory and practice of powder diffraction with a strong emphasis on the two most important applications: qualitative and quantitative analysis.



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X-Ray Diffraction

In Crystals, Imperfect Crystals, and Amorphous Bodies



By A. Guinier




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  • Publisher: Dover Publications

    Number Of Pages: 378

    Publication Date: 1994-06-07
  • Binding: Paperback
Book Description



Superb study begins with fundamentals of x-ray diffraction theory using Fourier transforms, then applies general results to various atomic structures, amorphous bodies, crystals and imperfect crystals. Elementary laws of x-ray diffraction on crystals follow as special case. Highly useful for solid-state physicists, metallographers, chemists, and biologists. 154 illustrations. 1963 edition.



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X-Ray Spectroscopy in Astrophysics

Lectures Held at the Astrophysics School X Organized by

the European Astrophysics Doctoral Network (EADN) in

Amsterdam, ... - October 3, 1997

(Lecture Notes in Physics)

By Jan van Paradijs, Johan A.M. Bleeker




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  • Publisher: Springer


    Number Of Pages: 530


    Publication Date: 1999-03-19
  • Binding: Hardcover
Product Description





This volume contains a comprehensive treatment of X-ray spectroscopy, as applied in astrophysics. It is presented in the form of extensive notes of lectures given by seven distinguished scientists at the Tenth Summer School of the European Astrophysics Doctoral Network. The subjects covered are: basic line and continuum radiation processes in X-ray and gamma-ray astronomy; atomic physics of collision- and radiation-dominated plasmas; X-ray spectroscopic observations with ASCA and BeppoSAX; future X-ray spectroscopy missions; X-ray optics, and X-ray spectroscopy instrumentation. The book, which will appeal to both researchers and graduate students, is timely in view of the scheduled launches of the big X-ray observatories AXAF and XMM in 1999.



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X-Ray Diffraction by Polycrystalline Materials


Publication Date: 2008-02-04


By Rene Guinebretiere




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  • Publisher: ISTE Publishing Company

  • Number Of Pages: 288
  • Publication Date: 2008-02-04
  • Binding: Hardcover
Book Description


This book presents a physical approach to the diffraction phenomenon and its applications in materials science.

An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction.
Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.






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Ultraviolet and X-ray Spectroscopy of the Solar Atmosphere

(Cambridge Astrophysics)


By Kenneth J. H. Phillips, Uri Feldman, Enrico Landi

Publication Date: 2008-08-11




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  • Publisher: Cambridge University Press
  • Number Of Pages: 360
  • Publication Date: 2008-08-11
  • Binding: Hardcover
Product Description



The solar atmosphere, above the Sun's surface layers, reaches mega-kelvin temperatures and high levels of dynamic activity through processes involving a pervading magnetic field. This book explores one of the principal means of understanding the solar atmosphere, its ultraviolet and soft X-ray emission. The ultraviolet and X-ray spectra of the Sun's atmosphere provide valuable information about its nature - the heat and density of its various parts, its dynamics, and chemical composition. The principles governing spectral line and continuous emission, and how spectral studies lead to deductions about physical properties, are described, together with spacecraft instrumentation from Skylab, SolarMax, Yohkoh, SOHO, TRACE, and Hinode. With introductions to atomic physics and diagnostic techniques used by solar spectroscopists, a list of emission lines in ultraviolet and soft X-ray regions, and a glossary of terms, this is an ideal reference for graduate students and researchers in astrophysics and solar physics.



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X-ray and Neutron Reflectivity

Principles and Applications

(Lecture Notes in Physics)



By Jean Daillant, Alain Gibaud


Publication Date: 2009-01-01






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  • Publisher: Springer
  • Number Of Pages: 348
  • Publication Date: 2009-01-01
  • Binding: Hardcover
Product Description

This book is the first comprehensive introduction to X-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction on the interaction of X-rays and neutrons with matter, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next , in chapters 3 and 4 . The approximations are rigorously introduced and many experimental effects are discussed. The specific aspects of neutron reflectivity require separate treatment, given in chapter 5. Chapter 6 turns to X-ray reflectivity by rough multilayers. Eventually, chapter 7 introduces and discusses the by now well-established method of grazing incidence small angle X-ray scattering to investigate nanostructures.
For the second edition, the material has been completely reorganized so as to meet the demand for a modern multi-author textbook for PhD students and young researchers. All chapters have further been throughly revised, updated and, where appropriate, suitably augmented.
The first edition was been published as Lect. Notes Phys. m58 in the same series.


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Parametric X-Ray Radiation in Crystals
Theory, Experiment and Applications

(Springer Tracts in Modern Physics)


By Vladimir G. Baryshevsky, Ilya D. Feranchuk, Alexander P. Ulyanenkov





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  • Publisher: Springer
  • Number Of Pages: 171
  • Publication Date: 2006-02-10
  • Binding: Hardcover
Book Description



This systematic and comprehensive monograph is devoted to parametric X-ray radiation (PXR). This radiation is generated by the motion of electrons inside a crystal, whereby the emitted photons are diffracted by the crystal and the radiation intensity critically depends on the parameters of the crystal structure. Nowadays PXR is the subject of numerous theoretical and experimental studies throughout the world. The first part of the book is a theoretical treatment of PXR, which includes a new approach to describe the radiation process in crystals. The second part is a survey of PXR experimental results and the possible applications of PXR as a tool for crystal structure analysis and a source of tunable X-ray radiation.


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Electron Dynamics by Inelastic X-Ray Scattering

(Oxford Series on Synchrotron Radiation)

By Winfried Schuelke



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  • Publisher: Oxford University Press, USA
  • Number Of Pages: 464
  • Publication Date: 2007-08-16
  • Binding: Hardcover
Product Description


Knowledge of the dynamics of many-electron systems is of fundamental importance to all disciplines of condensed matter physics. A very effective access to electron dynamics is offered by inelastic X-ray scattering (IXS) spectroscopy. The double differential scattering cross section for IXS is directly related to the time-dependent two-particle density correlation function, and, for large momentum and energy transfer (Compton limit) to the electron momentum distribution. Moreover, resonant inelastic X-ray scattering (RIXS) enables the study of electron dynamics via electronic excitations in a very selective manner (e.g. selectively spin, crystal momentum, or symmetry), so that other methods are efficaciously complemented. The progress of IXS spectroscopy is intimately related to the growing range of applications of synchrotron radiation. The aim of the book is to provide the growing community of researchers with accounts of experimental methods, instrumentation, and data analysis of IXS, with representative examples of successful applications, and with the theoretical framework for interpretations of the measurements.

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Energy Dispersive

X-ray Analysis in the Electron Microscope

(Microscopy Handbooks)

By DC Bell


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  • Publisher: Garland Science
  • Number Of Pages: 156
  • Publication Date: 2003-01-01
  • Binding: Paperback
Product Description





This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical method is more suitable for their planned application.



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Thin Film Analysis by X-Ray Scattering

by Mario Birkholz




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Product Details


  • Hardcover: 378 pages
  • Publisher: Wiley-VCH
  • (February 6, 2006)
  • Language: English
Product Description




With contributions by Paul F. Fewster and Christoph Genzel
While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications.
Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.




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X-ray Scattering and Absorption by Magnetic Materials

(Oxford Series on Synchroton Radiation, 1)


by S. W. Lovesey, S. P. Collins



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Publisher: Oxford University Press, USA


Number Of Pages: 392
  • Publication Date: 1996-07-11
  • Binding: Hardcover
Product Description





Magnetic materials are currently the focus of a great deal of research activity. Their properties pose great intellectual challenges to physicists and chemists, and the increase of activity in this field is likely to continue with the arrival of third generation facilities such as the European Synchotron Radiation Facility and Advanced Light Source. This is the first book devoted to the use of x-ray beam techniques to study magnetic properties of materials, serving as an ideal reference source. It covers both experimental and theoretical issues in topics such as dichroism, elastic scattering, and spectroscopy.




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Diffuse X-Ray Scattering
and Models of Disorder International Union of
Crystallography Monographs on Crystallography

By T. R. WelberryPublisher



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: Oxford University Press, USA
  • Number Of Pages: 280



    Publication Date: 2004-11-18

  • Binding: Hardcover

Product Description





Diffuse X-ray scattering is a rich (virtually untapped) source of local structural information over and above that obtained by conventional crystallography. The book aims to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analyzed. Part I of the book gives a description of the experimental methods used to obtain diffuse scattering data. Part II describes a number of simple stochastic models of disorder, which allows various concepts to be established and enables simple examples to be generated to illustrate key principles. Part III describes example studies of a wide variety of real materials. These examples not only document the development of computer simulation methods for investigating and analyzing disorder problems but also provide a resource for helping future researchers recognize the kinds of effects which can occur and for pointing the way to tackling new problems which are encountered.

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Fifty Years of X-Ray Diffraction



By Ewald; P. P.



  • Publisher: Interanational Union of Crystallography
  • Number Of Pages:

    Publication Date: 1962

    ISBN-10 / ASIN: B000KK6D2Y
  • ISBN-13 / EAN:
  • Binding: Hardcover
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Principles of quantitative X-ray fluorescence analysis
Author: Tertian.
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